Description
Image segmentation is a key bottleneck in analysis of electron microscope (EM) images, made challenging by the fact that many features in EM images differ not in intensity but in texture.
I have explored several options for texture segmentation of images, based on feature vectors generated from local histograms of filtered versions of the image, which are then classified using a Support Vector Machine (SVM).
I find that while these algorithms perform better than chance, they do not outperform a naive thresholding algorithm. More work must be done to optimize feature vectors for better separation and to improve the SVM classification for better segmentation.
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